The Agilent E5262A lowers your cost-of-test by providing a high-speed parametric test solution for semiconductor, RFIC, and optical component testing needs. Key features include a high-speed DC measurement of current and voltage, enhanced measurement speed for fast throughput, expanded program memory, 16 digital I/O lines for sophisticated triggering requirements, and parallel test capability, all priced to affordably provide the ideal balance of functionality.

Industry Challenges

Engineers and scientists working on current and future semiconductor devices, monolithic microwave integrated circuits (MMICs), RFICs, and optical components require fast, flexible and robust instrument-based testing solutions to lower the cost-of-test.  Testing requirements can be a moving target, which often frustrates efforts to predict testing needs in the future.  The ideal answer is a solution that provides the exact testing resources needed today without exorbitant capital investment. Alternatives on the market consist of single SMUs, which present many challenges with respect to synchronization and achieving fast trigger response.  Available alternatives also cannot always supply sufficient current to meet the testing needs of modern devices.

Summary

Fast measurement that lowers cost-of-test

The fast measurement speed of the E5262A makes it an ideal choice for high-speed production test in situations requiring only one or two SMUs. Based on Agilent 4070 Series system technology, the Agilent E5262A lowers your cost-of-test with a high-speed parametric test solution for semiconductor, RFIC, and optical component testing. Two MPSMU modules and a ground unit are included in the E5262A, providing just enough test capability for many component-testing needs. The E5262A provides superior measurement throughput, several times faster than earlier products such as the Agilent 4142B. A number of innovative design elements help to improve the efficiency of complex testing, such as expanded program memory to accelerate the measurement process, and 16 digital I/O lines for sophisticated triggering requirements.

• High measurement speed
  The E5262A performs DC measurements of current and voltage and achieves measurement speeds that are 2-3 times faster than that of the Agilent 4142B. Easily migrate from your current 4142B test environment to the E5262A because programs developed for the 4142B can run on the E5262A with only minor modification.
• Innovative design elements support complex testing and improve efficiency
  Program memory has been greatly enhanced, with storage capacity for up to 40,000 command lines, which accelerates the measurement process. A fast and flexible advanced triggering scheme, based upon 16 digital I/O lines, in addition to the BNC trigger-in & trigger-out connectors, is ideal for sophisticated triggering requirements. Also, trigger signals are routed through hardware rather than firmware, resulting in the fastest instrument response possible. To enable parallel testing, each SMU is equipped with its own analog-to-digital converter (ADC) therefore no bottlenecks. Engineers can perform and report spot measurements easily via a simple front-panel interface, without programming. In addition, you can use the same user interface to view other items of interest, such as error messages when debugging the instrument performance under automated control.
• Cost-effective solution for simple parametric test requirements
  Many component measurements, such as laser diode and photo diode characterization, require only one or two source/monitor units. The configuration of the E5262A provides the ideal balance of functionality for such tasks at an affordable price.

Features:

• Perform high- speed, dc parametric
• measurements
• Y User interface allows spot
• measurements to be made from the
• front panel
• Y High- speed ADC present on each
• installed SMU
• Y 2.2 Amp ground unit
• Y BNC trigger- in and trigger- out
• connectors
• Y 16 general- purpose digital I/Os
• Y Program memory
• Y GPIB port for instrument control
• Y Self- test, self- calibration, diagnostics

Measurement Modes:

• Spot
• Y Pulsed Spot
• Y Quasi-pulsed Spot
• Y Staircase Sweep
• Y Multi-Channel Sweep
• Y Pulsed Sweep
• Y Staircase Sweep with Pulsed Bias
• Y Linear Search
• Y Binary Search