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Keysight (Agilent) 4156B

Precision Semiconductor Parameter Analyzer
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Description

Agilent 4155B/4156B is an electronic instrument for measuring and analyzing the characteristics of semiconductor devices. This one instrument allows you to perform both measurement and analysis of measurement results.

  • High-resolution/accuracy and wide range. I: 1 fA to 1 A (20 fA offset accuracy), V: 1 µV to 200 V
  • Fully-automated I-V sweep measurements with dc or pulse mode, expandable up to 6 SMUs
  • Synchronized stress/measure function, two high-voltage pulse generator units (±40 V)
  • Time-domain measurement: 60 µS variable intervals, up to 10,001 points
  • Easy to use: knob-sweep similar to curve tracer, automatic analysis functions
  • Automation: built-in HP Instrument BASIC, trigger I/O capability

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