Hioki LCR and Impedance Analyzers range from 1MHz to 300MHz devices to suit a wide range of applications in the testing of electronic components. The IM7580 offers a top measurement time of 0.5ms over a 1MHz to 300MHz frequency, and both LCR and Analyzer Modes to meet applications for both high volume production inspections and research and development.

• 1 MHz to 300 MHz testing source frequency
  
• Fastest test speed of 0.5 msec
  
• ±0.72% rdg. basic accuracy
  
• Compact, half-rack footprint with space-saving test head
  
• Comprehensive contact check (via DCR testing, Hi-Z reject or waveform judgment)
  
• Make frequency sweeps, level sweeps and time interval measurements in Analyzer Mode