Keysight (Agilent) 4291A
RF Impedance/Material Analyzer
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Description
Hewlett Packard 4291A RF Impedance Analyzer
Basic Accuracy ± 0.8%
Advanced Calibration and Error Compensation.
Four component test fixtures (DUT size: 0.5 mm to 20 mm)
Independent parameter selection in 2 channels
Direct read-out permittivity, permeability
Two material fixtures (opeating temperature: -55 degree to +200 degree C)
Versatile analysis (temperature, cole-cole plot, relaxation time)
Swept parameters (frequency, ac level, dc bias, temperature)
HP 4291A impedance/material analyzer provides a total solution for high-accuracy and easy measurement of surface-mount components and dielectric/magnetic materials. The 4291A uses a direct current-voltage measurement technique, as opposed to the reflection measurement technique, for more accurate impedance measurement over wide impedance range. Basic impedance accuracy is ± 0.8%. High Q accuracy enables low-loss component analysis. An internal synthesizer sweeps frequency from 1 MHz to 1.8 GHz with 1 mHz resolution. A 1.8 m error-less cable connects the analyzer to a test station so you can extend your test point away from the analyzer without losing accuracy. Advanced calibration and error compensation function eliminate measurement error factors in fixtures and assure high accuracy and repeatability at DUT/MUT.
The 4291A also provides automatic level control and monitor of test signals by using I-BASIC programming function; devices can be measured under a constant voltage or current. Measure bias-dependent impedance characteristics with optional dc bias (up to 40V and 100mA). At the push of a button, the built-in Equivalent Circuit Analysis Function automatically calculates the circuit constant values of five circuit models (similar to 4194A's Equivalent Circuit Analysis Function.)
The 4291A has two measurement channels; each channel can be set to measure a single (e.g., Z) or dual (e.g., Z-theta) impedance parameter. The color CRT with split-display can show both active traces and memory traces (stored in RAM). A built-in floppy disk drive stores programs and test data in either LIF or MS-DOS format.
With optional IBASIC (Opt 1C2), you can control external test equipment such as a temperature chamber or wafer prober directly from the 4291A. You do not need a separate instrument controller. Opt 1C2 gives you a keyboard and the HP IBASIC programming language for test automation and integration.
Material Evaluation:
The 4291A enables easy and sophisticated material evaluation and improves material evaluation quality and efficiency. The 4291A provides the total dielectric/magnetic material measurement solutions in wide frequency range (1 MHz to 1.8 GHz).
Key Features
Direct material parameters read-out (permitivity, permeability)
Material analysis functions (cole-cole plots, relaxation time analysis)
Versatile evaluation using a variety of swept parameters (frequency, signal level, temperature, etc.)
Test Fixtures:
Select from four types of component test fixtures: 16191A, 16192A, 16193A, and 16194A. These test fixtures directly connect to the test station's APC7 connector. Each fixture is designed for a different component size range, from 0.5 mm to 20 mm, and can handle different types of termination. These adjustable fixtures simplify device connection. For temperature coefficient testing, the 16194A high-temperature component test fixture can be used in a temperature oven from -55° to +200°C. Together with the 4291A's built-in compensation software, the fixtures ensure impedance accuracy and measurement repeatability. The 16453A dielectric material test fixture and 16454A magnetic material test fixture improve the accuracy and ease of use for permittivity or permeability measurements. These material fixtures have wide operating temperature of -55° to +200°C.
For measuring thin-film devices and semiconductors, the 4291A easily interfaces to a wafer prober. An extension cable connects the 4291A's test head to a probe station. For temperature and humidity testing, the 4291A can control an external temperature/humidity chamber via HP-IB and display the measurement result vs. temperature or humidity.
Ease of Use:
With the 4291A, impedance testing is easy. The analyzer comes with on-line calibration and compensation routine to simplify the task. Markers and limit-line function offer quick data analysis.
List of Options
| 001 | DC Bias |
| 002 | Material Measurement Firmware |
| 004 | Recorder Outputs |
| 011 | Delete High Impedance Head |
| 012 | Add Low Impedance Test Head |
| 013 | High Temperature/ High Impedance Test Head |
| 014 | High Temperature/ Low Impedance Test Head |
| 16091A | Coaxial Test Fixture |
| 16092A | Spring Clip Test Fixture |
| 16093A | Binding Post Test Fixture |
| 16093B | Binding Post Test Fixture |
| 16094A | Probe Fixture |
| 1C2 | IBASIC, HIL Keyboard & Cable |
| 1D5 | High Stability Frequency Reference |