The 172 Programmable Test Fixture is used with the 576 Curve Tracer, this module permits you to program a sequence of tests of J FETs, transistors, and diodes. Performs up to eleven preprogrammed different tests on each device. A variable rate control is provided to allow the operator a comfortable level of activity or the tests may be sequenced manually. Tests include measurement of Hfe, Vce, Iceo, Ices, Icer, Icbo, Iebo and for J FET's: Vp, Idss, Rds, Igss and BVgss. The 172 can drive the device under test to 10 A peak or 500 V.