Tektronix BSA125C

BSA125C BERTScope 12.5 Gb/s Bit Error Ratio Analyzer

Units Avialble for Purchase

Tektronix BSA125C
\PCISTR - Add PCIE Extended Stress Generation (requires STR)
\SF - Add Symbol Filtering option SW
\STR - Stressed Signal Generation (Includes option ECC, MAP,PL,XSSC,JTOL)
Available via Tektronix Encore starting at $70,000.00
Last Updated: 06/21/18

The BERTScope Bit Error Rate Tester Series provides a new approach to signal integrity measurements of serial data systems. Perform bit error rate detection more quickly, accurately, and thoroughly by bridging eye diagram analysis with BER pattern generation. The BERTScope Bit Error Rate Tester Series enable you to easily isolate problematic bit and pattern sequences, then analyze further with advanced error analysis that deliver unprecedented statistical measurement depth.

Key performance specifications

  • Pattern Generation and Error Analysis, High-speed BER Measurements up to 12.5 Gb/s
  • Fast Input Rise Time / High Input Bandwidth Error Detector for Accurate Signal Integrity Analysis
  • Physical Layer Test Suite with Mask Testing, Jitter Peak, BER Contour, and Q-factor Analysis for Comprehensive Testing with Standard or User-defined Libraries of Jitter Tolerance Templates
  • Integrated Eye Diagram Analysis with BER Correlation
  • Optional Jitter Map Comprehensive Jitter Decomposition - with Long Pattern (i.e. PRBS-31) Jitter
  • Patented Error Location Analysis™ enables Rapid Understanding of your BER Performance Limitations and Assess Deterministic versus Random Errors, Perform Detailed Pattern-dependent Error Analysis, Perform Error Burst Analysis, or Error-free Interval Analysis

Key features

  • Integrated, calibrated stress generation to address the stressed receiver sensitivity and clock recovery jitter tolerance test requirements for a wide range of standards
    • Sinusoidal jitter to 100 MHz
    • Random jitter
    • Bounded, uncorrelated jitter
    • Sinusoidal interference
    • Spread spectrum clocking
    • PCIe 2.0 & 3.0 receiver testing
    • F/2 jitter generation for 8xFC and 10GBASE-KR testing
    • IEEE802.3ba & 32G fibre channel testing
  • Electrical stressed eye testing for
    • PCI express
    • 10/40/100 Gb Ethernet
    • SFP+/SFI
    • OIF/CEI
    • Fibre channel (FC8, FC16, FC32)
    • SATA
    • USB 3.1 
    • InfiniBand (SDR, QDR, FDR, EDR)
  • Tolerance compliance template testing with margin testing
  • Integrated eye diagram analysis with BER correlation


  • Design verification including signal integrity, jitter, and timing analysis
  • Design characterization for high-speed, sophisticated designs
  • Certification testing of serial data streams and high performance Networking systems
  • Design/Verification of high-speed I/O components and systems
  • Signal integrity analysis – mask testing, jitter peak, BER contour, jitter map, and q-factor analysis
  • Design/Verification of optical transceivers



Pattern Generation and Error Analysis, highspeed BER Measurements up to 12.5 Gb/sec. The combination of impairment modulation, signal generation and analysis in one instrument enables receiver BER compliance testing for today's 3rd Generation Serial and 100G standards like; IEEE802.3ba, OIF-CEI and 32GFC communications standards.
Integrated Stress Generator for stressed eye sensitivity (SRS) and jitter tolerance compliance testing. A test signal's data rate, applied stress, and data pattern can be changed on the fly, independent of each other; enabling a diverse set of signal variations for testing chipset/system sensitivity.
Integrated, BER correlated eye diagram analysis with pass/fail masks for PCI Express, USB, SATA and other communications standards. Enhances the debug experience unlike other BERT's by providing a familiar eye diagram of the test results to compare against a standards specific mask.
Error Location and BER contour analysis on PRBS 31 and other digital signals up to 12.5 Gb/sec. Provides a quick understanding of signal integrity in terms of BER. Error location provides detailed BER pattern sensitivities to speed up identification of deterministic vs. random BER errors.
Optional Jitter Map provides fast jitter decomposition, accurate stress calibration at the DUT input. Fast, effective method
Data rate range
0.1 to 12.5 Gb/s
Normal or inverted
Variable cross over
25 to 75%
Hardware patterns
Industry-standard Pseudo-random (PRBS) of the following types: 2n – 1 where n = 7, 11, 15, 20, 23, 31 
RAM patterns
128 bits to 128 Mb total, allocated in 32 Mb portions to each of two A/B pages. Single page max is 128 Mb
Wide variety including SONET/SDH, Fibre Channel based such as k28.5, CJTPAT; 2n patterns where n = 3, 4, 5, 6, 7, 9; Mark Density patterns for 2n where n = 7, 9, 23; and many more
Error insertion
1, 2, 4, 8, 16, 32, 64 bit bursts
Single or repetitive
Clock outputs
Frequency range
Rise times are measured 20% to 80% unless otherwise stated. Specifications are following a 20-minute warm-up period. Specifications subject to change.
0.1 to 12.5 GHz 

1 Clock output frequency is ÷2 at data rates above 11.2 Gb/s.

Phase noise
< –90 dBc/Hz at 10 kHz offset (typical)
Clock output divide ratios
Opt. STR only (See the Clock path details below.)
Data clock amplitudes and offsets
Differential outputs, each side of pair individually settable for termination, amplitude, offset
DC coupled, 50 Ω reverse terminated, 3.5 mm connector. Calibration into 75 Ω selectable, other impedances by keypad entry. User-replaceable Planar Crown® adapter allows change to other connector types
Preset logic families
Variable, –2 to +2 V Presets: +1.5, +1.3, +1, 0, –2 V, AC coupled
Allowable amplitudes, terminations, and offsets
Refer to the following figures.


Amplitude swings between 0.25 and 2.0 V allowed; should fit inside shaded area of the following graph. For example, SCFL uses a 0 V termination, and operates between approximately 0 and –0.9 V; as shown with dotted arrow, it falls within the operating range.


Data clock waveform performance
Rise time
25 ps max, 23 ps typical (10-90%), 1 V amplitude, at 8.0 Gb/s

≤12 psp-p TJ (@8.0 Gb/s) typical

≤700 fs RMS Random Jitter (@8.0 Gb/s) typical

BSA125C, BSA175C
<500 fs RMS Random Jitter (@10.3125 Gb/s) typical
≤8 psp-p TJ (@28.05 Gb/s) typical

≤300 fs RMS Random Jitter (@28.05 Gb/s) typical

1 Measured at designated rate with PN15 pattern, BER 10-12.

Clock/data delay
Greater than 1 bit period in all cases
Up to 1.1 GHz
30 ns
Above 1.1 GHz
3 ns
100 fs
Self calibration
At time of measurement, when temperature or bit rate are changed, instrument will recommend a self calibration. Operation takes less than 10 seconds.


List of Options
A0 North America
A1 Universal EURO
A10 China
A11 India
A2 United Kingdom
A3 Australia
A4 240v North America
A5 Switzerland
A6 Japan
C3 Calibration Service 3 Yrs. Provides traceable or functional verification events whichever are applicable to the Product. Cals are at Tektronix recommended interval during the coverage period. Cal coverage includes the Manufactures Cal + 2 a
C5 Calibration Service 5 Yrs. Provides traceable or functional verification events whichever are applicable to the Product. Cals are at Tektronix recommended interval during the coverage period. Cal coverage includes the Manufactures Cal + 4 a
D1 Calibration Data Report
D3 Calibration Data Report 3 Years (with Option C3)
D5 Calibration Data Report 5 Years (with Option C5)
ECC Add Error Correction Coding Emulation SW (included in STR)
F2 F/2 Jitter Generation at 8 G and 10.3125 G (requires STR)
J-MAP Add Jitter Decomposition SW
JMAP Add Jitter Decomposition SW
JTOL Add Jitter Tolerance Templates SW (included in STR)
L0 English manual
LDA Add Live Data Analysis SW
MAP Add Error Mapping Analysis SW (included in STR)
PCISTR Add PCIE Extended Stress Generation (requires STR)
PL Add Physical Layer Test Suite SW (included in STR)
PVU Add PatternVu Equalization Processing SW
R3 Repair Service 3 Years (including warranty)
R3DW Repair service coverage 3 years (includes product warranty period); 3 year period starts at time of customer instrument purchase
R5 Repair Service 5 Years (including warranty)
SF Add Symbol Filtering option SW
SLD Add Stressed Live Data option SW
STR Stressed Signal Generation (Includes option ECC, MAP,PL,XSSC,JTOL)
XSSC Extended Spread Spectrum Clocking (SSC) & Increased SJ Range (included in STR)
Specifications & Attributes (BERT/Jitter Test)
Form Factor

Request a Quote