Keysight (Agilent) 4155B
Semiconductor Parameter Analyzer
Contact us for pricing and availability.
Description
The 4155B Semiconductor Paramer Analyzer is used to evaluate materials with measurements to 1 fA and 1 µV, automatically extract process parameters without manually manipulating screen markers, measures leakage characteristics with ultra-low leakage SMUs, automates device characterization with integrated pulse generators and selector switches.