Programmable Stimulus System
HFS9003 * HFS9009 * HFS9DG1 * HFS9DG2
Complete Stimulus Setup in Just Minutes
Specify Data and Timing on Every Pin
Up to 630 MHz Repetition Rate
Fully Digital Implementation
Up to 640 or More Phase-locked Channels
Independent Edge Placement
Precision Channel-to-channel Timing Alignment
1 ps Timing Resolution
GPIB (IEEE 488) Programmable
Maximum Control and Flexibility
Characterize CMOS, ECL, ACL, BiCMOS and GaAs Devices
Precise Clock Source
HFS9000 Stimulus System
When product designs were simple, and time-to-market not so critical, designers could afford the days, or even weeks, necessary to assemble, program, debug and characterize the various elements of a stimulus system and its fixturing. As product design complexity and market pressures have increased, however, designers of high-speed, high-performance circuits simply cannot afford this expenditure in time.
Now there's a solution. With Tektronix HFS9000 Stimulus Systems we've taken the features of a high-performance pulse generator, made them better and added complete data generation capabilities as well. We've eliminated the need for a switch matrix since we have data and timing on every pin. And the need for a separate power supply is gone, as the HFS9000 has the ability to produce the DC levels needed to drive logic lines directly. Finally, all these capabilities are present on every pin simultaneously, so you get extremely flexible formatting. Now you can set up a complete stimulus system in minutes, rather than hours or days, and test products more thoroughly throughout the development cycle.
The HFS9000 Series products were designed as completely programmable digital instruments rather than being based on traditional monostable analog architecture. This allows more capability and flexibility in pulse edge placement without the restrictions that analog instruments commonly impose. Now you can adjust both Delay and Width from 0 to 20 µs over all frequencies.
You can build a stimulus system with from four to 36 channels in one mainframe, and 640 or more channels across multiple phase-locked mainframes. Choose from the HFS9003 mainframe with 3-slot, 12-Channel capability, or the HFS9009 mainframe with 9-slot, 36-Channel capability. Both systems can include the 4-Channel HFS9DG1 and HFS9DG2 Data Time Generator cards in any combination.
All channels are slaved to a common clock, resulting in highly accurate channel-to-channel edge placement. This makes the HFS9000 ideal for precise characterization and evaluation of synchronous devices having multiple, and possibly interactive, inputs.
Full Channel Deskew Capability
All HFS9000 channels have independent, wide deskew ranges to allow precise pulse alignment and timing at the device under test (DUT). Deskew compensates for the timing differences caused by cabling and fixturing so your analysis can be focused on the relative timing at the DUT.
1 ps Timing Resolution
No other system lets you generate whatever combination of signals is required, with data and timing on every pin with 1 ps resolution. Now you can create data buses, clocks, strobes, gated clocks, logic level sources, pseudorandom bits and other stimuli with unequaled accuracy. You can perform setup and hold time margin tests by providing the clock, data, set and reset signals to the DUT. And you can hold inactive signals at programmable high or low logic levels, eliminating the need for external DC voltage sources and microwave switches.
630 MHz Repetition Rate
Accurate and repeatable AC measurements of prop delay, setup and hold time, and maximum operating frequency (fmax) require fast rep rates and edge speeds. With repetition rates up to 630 MHz, the HFS9000 is ideal for characterizing the most advanced logic families, and it can be used for testing component compliance with the SONET telecommunications standard. Transition times as fast as 250 ps (20%-80%) enable repeatable and accurate testing of the highest-speed ECL and GaAs digital devices. Variable transition time control from 800 ps to 6 ns is also available with the appropriate output levels for testing advanced CMOS, BiCMOS and TTL logic families.
Easy Editing of Setups and Vectors
Edit setups and vectors easily with BitWriter® software. With this Microsoft Windows based package you can build a complete test setup, including timing parameters, voltage levels, channel assignment and test vectors on your PC - ideal for remote test development. Individual setups and test vectors can be uploaded and stored when the HFS9000 has multiple users.
Programmability is important in developing automated, repeatable tests in R&D, incoming inspection and production of high-speed components. Therefore, the HFS9000 offers full implementation of the IEEE 488.2 standard and utilizes Tektronix Codes and Formats. GPIB/RS-232 ports provide for remote, fully programmable control. Coupled with a high-speed acquisition system, such as the TDS694D DSO, 11801B Digital Sampling Oscilloscope, or the most advanced logic analysis system on the market - the Tektronix TLA700, a fully automated test system can be developed with unequaled accuracy and repeatability.
Phase Lock Mode
Phase lock-in allows the internal time base to be phase-locked to an external frequency source. This "supercharger" capability can be used to augment the speed performance of automated component test systems by creating synchronized signals as fast as 630 MHz.
Card-modular design lets you adapt to any logic family from within the same mainframe. Choose the HFS9DG1 Data Time Generator card for 630 MHz bandwidth and <250 ps fixed rise time. The HFS9DG1 provides four channels of stimulus. This card is ideal for ECL and GaAs device characterization.
Or, choose the HFS9DG2 Data Time Generator card for up to 315 MHz bandwidth and variable transition times from 800 ps to 6 ns. The HFS9DG2 provides four channels of stimulus. This card is ideal for simulating TTL, CMOS and BiCMOS logic signals.
Combine these cards in any combination for testing a broad range of components or systems with mixed logic families.
From verifying critical parameters to full characterization, from developing manufacturing test vectors on the bench to phase-locked at-speed testing in conjunction with production test systems, the HFS9000 Data Time Generator simplifies the process while adding unmatched capabilities. You can, for example, create complex stimuli that are impossible with other systems. Download test vectors and timing parameters to the HFS9000 to set up worst-case conditions and to stimulate each pin in isolation. Vary voltage levels, pulse widths and timing relationships independently for each channel. Mix high-speed and variable transition time modules to fit your logic family and obtain channel counts unavailable in any other discrete instrument.
The Data Time Generator also provides a new dimension of assistance in characterizing pattern sensitivity. It provides the data stream while also creating the varying signal levels, timing relationships or signal characteristics required to detect pattern sensitivity across worst-case operating conditions.
Capabilities like these allow you to perform full characterizations on the first run, lowering your development costs and reducing your time to market.