Series 2600 System SourceMeter instruments offer electronic component and semiconductor device manufacturers a scalable, high throughput, highly cost-effective solution for precision DC, pulse, and low frequency AC source-measure testing. Building on the tightly integrated source-measure technology originally developed for Keithley's popular Series 2400 SourceMeter line, Series 2600 instruments provide from two to four times the test speed of competitive solutions in I-V functional test applications. They also offer higher source-measure channel density and a significantly lower cost of ownership than competing products. The analog-to-digital converters provide simultaneous I and V measurements in less than 100µs (10,000 rdgs/s) and source-measure sweep speeds of less than 200µs per point (5,500 points/s). This high speed source-measure capability, plus advanced automation features and time-saving software tools make Series 2600 SourceMeter instruments an ideal solution for I-V testing of a wide range of devices. Related Applications: ?I-V functional test and characterization of a wide range of devices, including: Discrete and passive components Two-leaded – Resistors, disk drive heads, metal oxide varistors (MOVs), diodes, zener diodes, sensors, capacitors, thermistors Three-leaded – Small signal bipolar junction transistors (BJTs), field-effect transistors (FETs), and more Parallel test – Two- and three-leaded component arrays Simple ICs – Optos, drivers, switches, sensors Integrated devices – Small Scale Integrated (SSI) and Large Scale Integrated (LSI) Analog ICs Radio frequency integrated circuits (RFICs) Application specific integrated circuits (ASICs) System on a chip (SOC) devices Optoelectronic devices such as light-emitting diodes (LEDs), laser diodes, high brightness LEDs (HBLEDs), vertical cavity surface-emitting lasers (VCSELs), displays R&D and device characterization of these types of devices