14.4GB/S Parallel Digital Pattern Generator

Testing of high performance data communications components or systems requires a digital data pattern generator with I/O flexibility and superior signal quality. The BA14400B 16-bit Parallel Pattern Generator is designed to meet these demanding research, development, and manufacturing test scenarios with the most flexible output interface in its class. Featuring variable amplitude and offset for both single-ended and differential outputs, the BA14400B supports any logic family you can name and is ideally suited for characterization of current and future telecom/datacom components and systems.

Pattern generation in the parallel domain can often provide significant cost savings for Mux/Demux and SERDES testing. Because the BA14400B generates industry standard pseudo-random patterns, it can be used in combination with popular serial bit error rate detectors, or with the companion BA14400B-PD BitAlyzer Bit Error Rate Detector and Error Analyzer, further reducing test system cost. 

When paired with the companion Parallel Bit Error Rate Detector, the patented BitAlyzers provide more than just bit error rate numbers. By studying the bit location of errors found in a data stream, BitAlyzers measure independent bits and burst error statistics, correlate errors to reveal pattern sensitivities, display the probability of having error bursts of different lengths, isolate systematic error sources, and much more.