Temperature Accuracy: ±0.5°C calibrated against transfer standard
Advanced ThermoChuck Design:
Low stray capacitance and high electrical resistance to ground: Surface Electrical Isolation: >109 ohms at 500 VDC between surface and ground at +25°C ; higher isolation configurations are available
Superior chuck temperature uniformity: ±0.5°C or ±0.5% of set temperature
Guarded ( low leakage) chuck configurations are optional
Standard Features:
IEEE-488 or RS232 remote interface
Proven high reliability
ThermoChuck interfaces to most major standard and automatic wafer probing stations, laser trimmers and inspection stations
No Liquid Nitrogen or CO2 is required for cooling.
HCFC-free and CFC-free
Certified Compliant
Applications:
Thermal cycling and steady- state thermal testing of wafers, hybrids and other flat devices from 0°C to +200°C
Moisture-free cold testing of wafers to 0°C with Controlled Environment Enclosure
Low noise test applications
High isolation and guarded ( low leakage) applications
Thermal characterization of standard and high power devices