The Agilent 85070D dielectric probe measures the dielectric properties of materials quickly and conveniently. Measurements made with this probe are nondestructive and require no sample preparation - saving you time, trouble, and material.

The dielectric probe is well-suited for measurements of liquid or semisolid materials. Simply immerse the probe into the material; there is no need for special fixtures. The Agilent 85070D dielectric probe yields permittivity (dielectric constant), loss facter, loss tangent, or Cole-Cole diagrams versus frequency - from 200 MHz to 20 GHz.

Features:

• Runs on a PC, or internally on the PNA series of network analyzers, eliminating the need for both a PC and a GPIB card.
• Guided calibration and measurement.
• Measure permittivity over a broad frequency range (200 MHz to 20 GHz).
• View measurement results in a variety of formats (er'', er'', tan delta or Cole-Cole).
• Hermetic glass-to-metal seal makes the probe resistant to corrosive or abrasive chemicals.
• Withstands a wide temperature range (-40C to +200C).
• Compatible with a variety of network analyzers.
• Component object model (COM) interface allows the measurement to be setup, triggered, and read from a user-written program. Example Visual Basic and Visual C++ projects are included to aid program development.