When combined with Cascade probes, the Agilent 85109C network analyzer system provides superior on-wafer measurement system, from 45 MHz to 75 GHz, or optionally to 110 GHz. Based on the Agilent 8510C network analyzer, the Agilent 85109C provides the highest performance in frequency coverage, dynamic range, and measurement accuracy. All the main system instruments, except for the Agilent 8510C, are integrated in a system rack prior to shipment from the factory. Installation is included at no additional charge.

To achieve superior dynamic range and still provide a single connection, the Agilent 85109C uses special low-loss test port combiners that couple the RF outputs of two test sets into a single 1.85 mm coaxial interface to wafer probes or a coaxial device. The system software enables performance of a single on-wafer or coaxial calibration, by automatically switching test bands and combining data from each test set. Error-corrected measurements are then displayed on the Agilent 8510C. The software alsocontrols dc biasing to the test device, providing the stimulus, calibration and measurement triggering normally accessed from the network analyzer front panel.

The Agilent 85109C offers short-open-load-thru (SOLT) calibration on 1.85 mm coax from 45 MHz to 65 GHz and line-reflect-match (LRM) for on-wafer measurements over the system''s full frequency range.

Features:

• 45 MHz to 75 GHz frequency range, optionally to 110 GHz
• Single RF connection to 65 GHz
• Broadband calibration and bias control
• Accurate and convenient on-wafer calibration