200 |
2-port, base hardware configuration |
201 |
2-port with configurable test set, reference mixer switch |
205 |
2-port with configurable test set, ref mixer switch, bias tees, low frequency extension |
210 |
2-port with metrology configuration |
217 |
2-port with configurable test set, reference mixer switch, source and receiver attenuators |
219 |
2-port with configurable test set, reference mixer switch, source and receiver attenuators, bias tees |
220 |
2-port with configurable test set, reference mixer switch, source and receiver attenuators, bias tees, low frequency extension |
400 |
4-port with second source |
401 |
4-port with second source, configurable test set, reference mixer switch |
405 |
4-port with second source, configurable test set, reference mixer switch, bias tees, low frequency extension |
410 |
4-port with second source, metrology configuration |
417 |
4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators |
419 |
4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators, bias tees |
420 |
4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators, bias tees, low frequency extension |
P04 |
|
S93007B |
Automatic fixture removal |
S93010B |
Time Domain |
S93011B |
Enhanced time domain analysis with TDR |
S93015B |
Real-time S-parameter and power measurement uncertainty |
S93025B |
Basic pulsed-RF measurements |
S93026B |
Advanced pulsed-RF measurements |
S93029B |
Noise figure measurements with vector correction |
S93080B |
Frequency offset measurements |
S93082B |
Scalar mixer/converter measurements |
S93083B |
Vector and scalar calibrated converter measurements |
S93084B |
Embedded LO measurements |
S93086B |
Gain-compression measurements |
S93087B |
Intermodulation distortion measurements |
S93088B |
Source phase control |
S93089B |
Differential and I/Q device measurements |
S93118B |
Fast CW Sweep |
W10 |
Windows 10 |