The E5503A phase noise measurement solution minimizes ATE test times for one-port VOC''s, DROs, crystal oscillators and synthesizers. The Agilent E5501B phase noise measurement solution has been designed to simplify phase noise measurements of one-port VCOs, DROs, crystal oscillators, and synthesizers and to maximize the capability for R&D benchtop applications. In addition, with a standard offset range capability from 0.01 Hz to 100 MHz, the Agilent E5501B provides the capability, flexibility and versatility to meet changing and demanding needs placed upon the R&D engineer. By building upon 30 years of Agilent Technologies low phase noise, RF design and measurement experience, the Agilent E5501B solution continues to provide excellent measurement integrity, repeatability and accuracy.

Features:

• 50 kHz to 18.0 GHz
• Quick and easy integration into your ATE system
• Fastest phase noise measurements available
• Ability to test a wide range of devices
• Measure AM noise directly
• Industry leading sensitivity
• Flexible configurations enhance sharing equipment with other measurements