Agilent Technologies pushes the limits of component measurements with the N7788A Component Analyzer. Its proprietary technology is comparable with the well-known Jones-Matrix-Eigenanalysis (JME) which is the standard method for measuring Polarization Mode Dispersion (PMD) or differential group delay (DGD) of optical devices.

Agilent’s new single scan technology offers a range of advantages to test a complete set of parameters:

• DGD/ PMD
• PDL
• Power / Loss
• TE / TM-Loss
• 2nd-order PMD
• Principal States of Polarization (PSPs)
• Jones and Mueller Matrices

Designed for the Manufacturing Floor

High throughput: A complete analysis across the C and the L band is performed in less than 10 seconds!

Software Drivers: A range of software drivers is available for external control of the system. This allows easy integration in common ERP systems.

Remote control: Control of the instrument through LAN or via the Internet is supported. This supports automation as well as trouble shooting.

Report Generation: Generating PDF reports is supported. The content including layout is configurable by the user.

Real time power readout: High throughput measurement of non-connectorized components is supported by providing a real time power readout which enables fiber coupling of the new device.

Barcode Scanner: Using Barcode scanner is supported for quick transfer of the DUT serial number.

Key Benefits

• Highest Accuracy in a single sweep: no averaging over multiple sweeps required
• High measurement speed
• Complete measurement across C/L-band in less than 10 seconds (no need to wait for many averages)
• Robustness against fiber movement / vibration and drift