The DSA8300 is a state-of-the-art Equivalent Time Sampling Oscilloscope that provides the highest fidelity measurement and analysis capabilities for Communications Signal Analysis, Serial Data Network Analysis, and Serial Data Link Analysis applications.

KEY PERFORMANCE SPECIFICATIONS

• Very low time base jitter:
  • 425 fs typical on up to 8 simultaneously acquired channels
  • <100 fs on up to 6 channels with 82A04B phase reference module
• Industry’s highest vertical resolution – 16 bit A/D
• Electrical resolution: <20 µV LSB (for 1 v full range)
• Optical resolution from <20 nW for the 80C07B (1 mW full range) to <0.6 µW for the 80C10C (30 mW full range)
• Optical bandwidths to >80 GHz
• Electrical bandwidths to >70 GHz
• Over 120 automated measurements for NRZ, RZ, and pulse signal types
• Automated mask testing with over 80 industry-standard masks

KEY FEATURES

A wide variety of optical, electrical, and accessory modules support your specific testing requirements.

• Optical modules
  • Fully integrated optical modules that support optical data rates from 155 Mb/s to 100 Gb/s
  • Certified optical reference receivers support specified requirements for standards-mandated compliance testing
  • Optical bandwidths to >80 GHz
  • High optical sensitivity, low noise, and wide dynamic range of the optical sampling modules allows accurate testing and characterization of short-reach to long-haul optical communications standards
  • Fully calibrated clock recovery solutions – no need to manually calibrate for data pick-off losses
  • Calibrated extinction ratio measurements ensure repeatability of extinction ratio measurements to <0.5 dB among systems with modules with this factory calibration option
• Electrical modules
  • Very low-noise electrical samplers (280 μV at 20 GHz, 450 μV at 60 GHz, typical)
  • Selectable bandwidths 1 allow the user to trade-off sampler bandwidth and noise for optimal data acquisition performance
  • Remote samplers 2 or compact sampling extender module cables support minimal signal degradation by allowing the sampler to be located in close proximity to the device under test
  • High-performance integrated TDR (10 ps typical step rise time) supports exceptional impedance discontinuity characterization and high dynamic range for S-parameter measurements to 50 GHz
• Analysis
  • Complete suite of over 120 automated measurements for NRZ, RZ, and pulse signal types
  • Automated mask testing with over 80 industry-standard masks. New masks can be imported into the DSA8300 to support new emerging standards. Users can define their own masks for automated mask testing
  • Vertical and horizontal histograms for waveform statistical analysis
  • Vertical, horizontal, and waveform cursors (with measurements)
  • Jitter, noise, BER, mask testing, and Serial Data Link Analysis (SDLA) are provided through the 80SJNB Essentials and Advanced Software Application Options
  • Advanced TDR analysis, S-parameter measurements, simulation model extraction, and serial link simulation capabilities are provided by the IConnect® Software Application options
• High test throughput
  • High sample acquisition rate up to 300 kS/s per channel
  • Efficient programmatic interface (IEEE-488, Ethernet, or local processor access) enables high test throughput