Teseq’s new NSG 3040 is an easy-to-use multifunction generator that simulates electromagnetic interference effects for immunity testing in conformity with international, national and manufacturers’ standards including the latest IEC/EN standards. The NSG 3040 system is designed to fulfi ll conducted EMC test requirements for CE mark testing, which generally include combination wave surge, Electrical Fast Transient (EFT) pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be confi gured for a much broader range of applications.

Featuring an innovative, modular design, the NSG 3040 is a versatile system that can be confi gured for basic testing needs and expanded to meet the needs of sophisticated test laboratories. Teseq’s well proven “Master-Slave” architecture enables individual pulse modules to be calibrated separately, with calibration data and correction factors stored on the slave controller. New modules can be easily installed with no need to return the entire system for calibration.

Using state-of-the-art components, the self-contained modules set new standards with respect to switching and phase accuracy and exceed the existing standards’ requirements.

A 7" touch panel display with superb contrast and color makes controlling the NSG 3040 easy. For fast and effi cient data entry, input devices include an integrated keyboard and a thumbwheel with additional keys for sensitivity adjustment. To achieve quick, reliable results in a development environment a standardized test can be initiated with just a few “clicks” using the integrated Test Assistance (TA) function.

Convenient touch input buttons make each parameter’s value highly visible and allow the user to quickly select and modify all settings. A stylus is not necessary, and ramp functions can be programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values can be changed easily.

With expert mode users can make manual parameter changes using the thumbwheel while a test is under way, providing an effective and fast method for identifying critical threshold values.

An easily accessible SD memory card allows fi rmware downloads to be performed quickly and tests to be saved. In the rare case that the storage space is not suffi cient, the card can be replaced by a commercially available SD memory card and existing test fi les can be easily copied onto the larger SD card.

The NSG 3040 has an Ethernet port for external PC control. The Windows-based control software simplifi es test programming and compilation of complex test sequences with various types of tests. Test reports can be generated during the test operation, allowing the operator to enter observations as the test progresses and increasing the effi ciency of long-term tests.

• Modular, expandable system
• Surge voltage to 4.4 kV
• EFT/Burst to 4.8 kV/1 MHz
• PQT to 16 A/260 VAC & DC
• Easy to use 7" color touch screen
• TA (Test Assistance) provides fast standard test settings
• Parameters can be changed while test is running
• Wide range of optional test accessories